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Homepage>BS Standards>71 CHEMICAL TECHNOLOGY>71.040 Analytical chemistry>71.040.40 Chemical analysis>BS ISO 18118:2024 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
immediate downloadReleased: 2024-03-04
BS ISO 18118:2024 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

BS ISO 18118:2024

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

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Standard number:BS ISO 18118:2024
Pages:32
Released:2024-03-04
ISBN:978 0 539 23627 9
Status:Standard

BS ISO 18118:2024 - Surface Chemical Analysis: Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Unlock the full potential of your surface chemical analysis with the latest standard, BS ISO 18118:2024. This comprehensive guide is essential for professionals utilizing Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) for the quantitative analysis of homogeneous materials.

Overview

The BS ISO 18118:2024 standard provides a detailed guide on the use of experimentally determined relative sensitivity factors (RSFs) in AES and XPS. These techniques are pivotal in surface chemical analysis, offering precise and reliable data for a wide range of applications, from materials science to nanotechnology.

Key Features

  • Standard Number: BS ISO 18118:2024
  • Pages: 32
  • Release Date: 2024-03-04
  • ISBN: 978 0 539 23627 9
  • Status: Standard

Why Choose BS ISO 18118:2024?

In the rapidly evolving field of surface chemical analysis, staying updated with the latest standards is crucial. The BS ISO 18118:2024 standard is meticulously designed to enhance your understanding and application of AES and XPS techniques. Here’s why this standard is indispensable:

Comprehensive Guidance

This standard offers in-depth guidance on the use of RSFs, ensuring that you can achieve accurate and reproducible results in your quantitative analysis. Whether you are a seasoned professional or new to the field, the clear and concise instructions will help you navigate the complexities of AES and XPS.

Enhanced Accuracy

By utilizing experimentally determined RSFs, you can significantly improve the accuracy of your surface chemical analysis. This standard provides the necessary tools and methodologies to ensure that your measurements are both precise and reliable.

Wide Applicability

The principles and techniques outlined in BS ISO 18118:2024 are applicable across a broad spectrum of industries and research fields. From materials science and engineering to nanotechnology and electronics, this standard is a valuable resource for any professional involved in surface chemical analysis.

Detailed Content

The BS ISO 18118:2024 standard is structured to provide a logical and comprehensive approach to surface chemical analysis using AES and XPS. Here’s a glimpse of what you can expect:

Introduction to AES and XPS

Gain a solid foundation with an introduction to the principles and applications of Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy. Understand the fundamental concepts and how these techniques can be applied to your specific needs.

Relative Sensitivity Factors (RSFs)

Learn about the importance of RSFs in quantitative analysis and how to determine them experimentally. This section provides detailed methodologies and best practices to ensure that your RSFs are accurate and reliable.

Quantitative Analysis of Homogeneous Materials

Explore the step-by-step process of conducting quantitative analysis using AES and XPS. This section covers everything from sample preparation to data interpretation, ensuring that you can achieve the highest level of accuracy in your analysis.

Practical Examples and Case Studies

Benefit from practical examples and case studies that illustrate the application of the standard in real-world scenarios. These examples provide valuable insights and help you apply the principles and techniques to your own work.

Who Should Use This Standard?

The BS ISO 18118:2024 standard is designed for a wide range of professionals, including:

  • Materials Scientists
  • Surface Chemists
  • Nanotechnologists
  • Engineers
  • Researchers and Academics
  • Quality Control Specialists

Whether you are working in a research laboratory, industrial setting, or academic institution, this standard will provide you with the knowledge and tools you need to excel in surface chemical analysis.

Stay Ahead with the Latest Standard

In the fast-paced world of surface chemical analysis, staying ahead of the curve is essential. The BS ISO 18118:2024 standard is your key to unlocking the full potential of AES and XPS techniques. With its comprehensive guidance and practical insights, this standard will help you achieve the highest level of accuracy and reliability in your quantitative analysis.

Don’t miss out on this essential resource. Equip yourself with the knowledge and tools you need to excel in surface chemical analysis with the BS ISO 18118:2024 standard.

Order Your Copy Today

Ensure that you have the latest and most comprehensive guide to surface chemical analysis at your fingertips. Order your copy of the BS ISO 18118:2024 standard today and take your AES and XPS techniques to the next level.

ISBN: 978 0 539 23627 9

Release Date: 2024-03-04

Pages: 32

Stay ahead in your field with the BS ISO 18118:2024 standard – your ultimate guide to surface chemical analysis using Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy.

DESCRIPTION

BS ISO 18118:2024


This standard BS ISO 18118:2024 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials is classified in these ICS categories:
  • 71.040.40 Chemical analysis