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immediate downloadReleased: 2015-11-30
BS ISO 19830:2015
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
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| Standard number: | BS ISO 19830:2015 |
| Pages: | 34 |
| Released: | 2015-11-30 |
| ISBN: | 978 0 580 86519 0 |
| Status: | Standard |
DESCRIPTION
BS ISO 19830:2015
This standard BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy is classified in these ICS categories:
- 71.040.40 Chemical analysis
The purpose of this International Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.