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07.030 Physics. Chemistry
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PD IEC TS 62607-2-5:2022
Nanomanufacturing. Key control characteristics Carbon nanotube materials. Mass density of vertically-aligned carbon nanotubes: X-ray absorption method
Nanomanufacturing. Key control characteristics Carbon nanotube materials. Mass density of vertically-aligned carbon nanotubes: X-ray absorption method
Released: 2022-11-22
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PD IEC TS 62607-5-3:2020
Nanomanufacturing. Key control characteristics Thin-film organic/nano electronic devices. Measurements of charge carrier concentration
Nanomanufacturing. Key control characteristics Thin-film organic/nano electronic devices. Measurements of charge carrier concentration
Released: 2020-04-22
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PD IEC TS 62607-5-4:2022
Nanomanufacturing. Key control characteristics Energy band gap measurement of nanomaterials by electron energy loss spectroscopy (EELS)
Nanomanufacturing. Key control characteristics Energy band gap measurement of nanomaterials by electron energy loss spectroscopy (EELS)
Released: 2022-12-13
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PD IEC TS 62607-6-16:2022
Nanomanufacturing. Key control characteristics Two-dimensional materials. Carrier concentration: Field effect transistor method
Nanomanufacturing. Key control characteristics Two-dimensional materials. Carrier concentration: Field effect transistor method
Released: 2022-11-29
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PD IEC TS 62607-6-3:2020
Nanomanufacturing. Key control characteristics Graphene-based material. Domain size: substrate oxidation
Nanomanufacturing. Key control characteristics Graphene-based material. Domain size: substrate oxidation
Released: 2020-11-02
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PD IEC TS 62607-8-1:2020
Nanomanufacturing. Key control characteristics Nano-enabled metal-oxide interfacial devices. Test method for defect states by thermally stimulated current
Nanomanufacturing. Key control characteristics Nano-enabled metal-oxide interfacial devices. Test method for defect states by thermally stimulated current
Released: 2020-04-27
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PD IEC TS 62607-9-1:2021
Nanomanufacturing. Key control characteristics Traceable spatially resolved nano-scale stray magnetic field measurements. Magnetic force microscopy
Nanomanufacturing. Key control characteristics Traceable spatially resolved nano-scale stray magnetic field measurements. Magnetic force microscopy
Released: 2022-11-22
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PD IEC/TR 62632:2013
Nanoscale electrical contacts and interconnects
Nanoscale electrical contacts and interconnects
Released: 2013-09-25
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