PRICES include / exclude VAT
Homepage>BS Standards>07 MATHEMATICS. NATURAL SCIENCES>07.030 Physics. Chemistry>PD IEC TS 62607-8-1:2020 Nanomanufacturing. Key control characteristics Nano-enabled metal-oxide interfacial devices. Test method for defect states by thermally stimulated current
Sponsored link
immediate downloadReleased: 2020-04-27
PD IEC TS 62607-8-1:2020 Nanomanufacturing. Key control characteristics Nano-enabled metal-oxide interfacial devices. Test method for defect states by thermally stimulated current

PD IEC TS 62607-8-1:2020

Nanomanufacturing. Key control characteristics Nano-enabled metal-oxide interfacial devices. Test method for defect states by thermally stimulated current

Format
Availability
Price and currency
English Secure PDF
Immediate download
270.40 USD
English Hardcopy
In stock
270.40 USD
Standard number:PD IEC TS 62607-8-1:2020
Pages:32
Released:2020-04-27
ISBN:978 0 539 13558 9
Status:Standard
DESCRIPTION

PD IEC TS 62607-8-1:2020


This standard PD IEC TS 62607-8-1:2020 Nanomanufacturing. Key control characteristics is classified in these ICS categories:
  • 07.120 Nanotechnologies
  • 07.030 Physics. Chemistry

There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. This part of IEC 62607 focuses on the former method, and specifies the measurement method to be developed for determining defect states of nanoenabled metal-oxide interfacial devices.

This document includes:

  • outlines of the experimental procedures used to measure TSC,

  • methods of interpretation of results and discussion of data analysis, and

  • case studies.