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First pagePrev12BS ISO 22489:2016
Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
Released: 2016-10-31
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BS ISO 23703:2022
Microbeam analysis. Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
Microbeam analysis. Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
Released: 2022-02-04
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BS ISO 23833:2013
Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary
Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary
Released: 2013-04-30
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15 results
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