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22 results
First pagePrev12BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Released: 2019-11-22
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25/30531414 DC
BS IEC 63672 Guidelines for evaluating DV/DT robustness of SIC power devices
BS IEC 63672 Guidelines for evaluating DV/DT robustness of SIC power devices
Released: 2025-09-05
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22.40 EUR
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176.96 EUR
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BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Released: 2006-09-29
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17/30366375 DC
BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
Released: 2017-11-30
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BS EN 62416:2010
Semiconductor devices. Hot carrier test on MOS transistors
Semiconductor devices. Hot carrier test on MOS transistors
Released: 2010-07-31
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150.08 EUR
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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22 results
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