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BS EN 60746-3:2002
Expression of performance of electrochemical analyzers Electrolytic conductivity
Expression of performance of electrochemical analyzers Electrolytic conductivity
Released: 2003-06-10
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BS EN ISO 15796:2008
Gas analysis. Investigation and treatment of analytical bias
Gas analysis. Investigation and treatment of analytical bias
Released: 2009-06-30
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BS EN 15964:2011
Breath alcohol test devices other than single use devices. Requirements and test methods
Breath alcohol test devices other than single use devices. Requirements and test methods
Released: 2011-06-30
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BS ISO 14975:2000
Surface chemical analysis. Information formats
Surface chemical analysis. Information formats
Released: 2001-05-15
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BS EN ISO 10723:2012
Natural gas. Performance evaluation for analytical systems
Natural gas. Performance evaluation for analytical systems
Released: 2013-05-31
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BS EN 60746-1:2003
Expression of performance of electrochemical analyzers General
Expression of performance of electrochemical analyzers General
Released: 2003-04-23
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BS EN 17298:2019
Animal feeding stuffs. Methods of sampling and analysis. Determination of benzoic and sorbic acid by High Performance Liquid Chromatography (HPLC)
Animal feeding stuffs. Methods of sampling and analysis. Determination of benzoic and sorbic acid by High Performance Liquid Chromatography (HPLC)
Released: 2019-08-16
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BS ISO 16129:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Released: 2018-11-19
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BS ISO 11775:2015
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Released: 2015-10-31
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BS ISO 14701:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Released: 2018-11-05
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BS ISO 22415:2019
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Released: 2019-05-14
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