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71.040.40 Chemical analysis
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BS ISO 16666:2025
Surface chemical analysis — Total reflection X-ray fluorescence — Principles and general requirements
Surface chemical analysis — Total reflection X-ray fluorescence — Principles and general requirements
Released: 2025-11-14
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BS EN ISO 14912:2025 - TC
Tracked Changes. Gas analysis. Conversion of gas mixture composition data
Tracked Changes. Gas analysis. Conversion of gas mixture composition data
Released: 2025-06-16
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BS ISO 5861:2024
Surface chemical analysis. X-ray photoelectron spectroscopy. Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
Surface chemical analysis. X-ray photoelectron spectroscopy. Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
Released: 2024-06-13
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PD ISO/TR 4550:2026
Surface chemical analysis — Surface chemical analysis of bacteria and biofilms
Surface chemical analysis — Surface chemical analysis of bacteria and biofilms
Released: 2026-02-02
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26/30472772 DC
BS ISO 12467-3 Chemical analysis of lithium composite oxides Part 3: Determination of lithium carbonate and lithium hydroxide contents
BS ISO 12467-3 Chemical analysis of lithium composite oxides Part 3: Determination of lithium carbonate and lithium hydroxide contents
Released: 2026-01-22
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26/30494233 DC
BS ISO 25121 Light olefins for industrial use — Determination of trace sulfur — Ultraviolet fluorescence method
BS ISO 25121 Light olefins for industrial use — Determination of trace sulfur — Ultraviolet fluorescence method
Released: 2026-01-29
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BS ISO 25095-1:2026
Propylene oxide for industrial use Determination of purity and trace impurities by gas chromatography
Propylene oxide for industrial use Determination of purity and trace impurities by gas chromatography
Released: 2026-03-24
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BS EN ISO 6145-7:2018
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Thermal mass-flow controllers
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Thermal mass-flow controllers
Released: 2019-01-04
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BS ISO 15470:2017
Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
Released: 2017-03-31
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BS ISO 22415:2019
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Released: 2019-05-14
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BS ISO 17974:2002
Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis
Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis
Released: 2002-11-29
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PD ISO/TR 18394:2016
Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
Released: 2016-05-31
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