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BS ISO 15470:2017
Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
Released: 2017-03-31
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PD ISO/TR 18394:2016
Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
Released: 2016-05-31
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BS ISO 22415:2019
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Released: 2019-05-14
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BS ISO 17974:2002
Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis
Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis
Released: 2002-11-29
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BS EN 17298:2019
Animal feeding stuffs. Methods of sampling and analysis. Determination of benzoic and sorbic acid by High Performance Liquid Chromatography (HPLC)
Animal feeding stuffs. Methods of sampling and analysis. Determination of benzoic and sorbic acid by High Performance Liquid Chromatography (HPLC)
Released: 2019-08-16
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BS ISO 16129:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Released: 2018-11-19
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BS ISO 14701:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Released: 2018-11-05
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BS ISO 11775:2015
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Released: 2015-10-31
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BS EN ISO 6145-7:2018 - TC
Tracked Changes. Gas analysis. Preparation of calibration gas mixtures using dynamic methods Thermal mass-flow controllers
Tracked Changes. Gas analysis. Preparation of calibration gas mixtures using dynamic methods Thermal mass-flow controllers
Released: 2020-02-24
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BS EN ISO 16664:2017 - TC
Tracked Changes. Gas analysis. Handling of calibration gases and gas mixtures. Guidelines
Tracked Changes. Gas analysis. Handling of calibration gases and gas mixtures. Guidelines
Released: 2020-02-26
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BS ISO 6142-1:2015+A1:2020
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Released: 2022-11-08
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BS ISO 14606:2022 - TC
Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Released: 2023-02-17
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