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BS ISO 14237:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
Released: 2010-08-31
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BS EN 50436-3:2016
Alcohol interlocks. Test methods and performance requirements Guidance for authorities, decision makers, purchasers and users
Alcohol interlocks. Test methods and performance requirements Guidance for authorities, decision makers, purchasers and users
Released: 2017-01-31
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BS EN 61207-6:2015
Expression of performance of gas analyzers Photometric analyzers
Expression of performance of gas analyzers Photometric analyzers
Released: 2015-01-31
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BS EN ISO 6145-10:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
Released: 2009-02-28
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BS 5443:1977
Recommendations for a standard layout for methods of chemical analysis by gas chromatography
Recommendations for a standard layout for methods of chemical analysis by gas chromatography
Released: 1977-11-30
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BS EN ISO 6145-11:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Electrochemical generation
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Electrochemical generation
Released: 2009-06-30
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BS ISO 14706:2014
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Released: 2014-07-31
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PD ISO/TR 19319:2013
Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
Released: 2013-03-31
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BS ISO 18516:2006
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
Released: 2006-11-30
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DD ISO/TS 29041:2008
Gas mixtures. Gravimetric preparation. Mastering correlations in composition
Gas mixtures. Gravimetric preparation. Mastering correlations in composition
Released: 2009-02-28
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BS ISO 24237:2005
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Released: 2005-09-11
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