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71.040.40 Chemical analysis
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BS ISO 6142-2:2024
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II mixtures
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II mixtures
Released: 2024-02-07
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BS ISO 20579-1:2024
Surface chemical analysis. Sample handling, preparation and mounting Documenting and reporting the handling of specimens prior to analysis
Surface chemical analysis. Sample handling, preparation and mounting Documenting and reporting the handling of specimens prior to analysis
Released: 2024-09-24
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BS EN ISO 14912:2025
Gas analysis. Conversion of gas mixture composition data
Gas analysis. Conversion of gas mixture composition data
Released: 2025-05-22
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BS ISO 11505:2025
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Released: 2025-06-23
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BS ISO 11505:2025 - TC
Tracked Changes. Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Tracked Changes. Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Released: 2025-07-16
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BS ISO 20289:2025
Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
Released: 2025-06-06
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BS EN ISO 6144:2006
Gas analysis. Preparation of calibration gas mixtures. Static volumetric method
Gas analysis. Preparation of calibration gas mixtures. Static volumetric method
Released: 2007-02-28
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PD ISO/TR 16268:2009
Surface chemical analysis. Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation
Surface chemical analysis. Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation
Released: 2009-11-30
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BS EN 16785-2:2018
Bio-based products. Bio-based content Determination of the bio-based content using the material balance method
Bio-based products. Bio-based content Determination of the bio-based content using the material balance method
Released: 2018-04-23
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BS ISO 20341:2003
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
Released: 2003-08-08
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BS ISO 16243:2011
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Released: 2011-12-31
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BS ISO 17560:2014
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
Released: 2014-09-30
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