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71.040.40 Chemical analysis
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BS ISO 20289:2025
Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
Released: 2025-06-06
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BS ISO 11505:2025 - TC
Tracked Changes. Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Tracked Changes. Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Released: 2025-07-16
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BS EN ISO 14912:2025
Gas analysis. Conversion of gas mixture composition data
Gas analysis. Conversion of gas mixture composition data
Released: 2025-05-22
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25/30500395 DC
BS ISO 13084 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
BS ISO 13084 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Released: 2025-03-17
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BS EN 61207-1:2010
Expression of performance of gas analyzers General
Expression of performance of gas analyzers General
Released: 2011-02-28
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BS EN 16785-1:2015
Bio-based products. Bio-based content Determination of the bio-based content using the radiocarbon analysis and elemental analysis
Bio-based products. Bio-based content Determination of the bio-based content using the radiocarbon analysis and elemental analysis
Released: 2015-12-31
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BS 2511:1970
Methods for the determination of water (Karl Fischer method)
Methods for the determination of water (Karl Fischer method)
Released: 1970-04-30
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BS EN 16785-2:2018
Bio-based products. Bio-based content Determination of the bio-based content using the material balance method
Bio-based products. Bio-based content Determination of the bio-based content using the material balance method
Released: 2018-04-23
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PD ISO/TR 16268:2009
Surface chemical analysis. Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation
Surface chemical analysis. Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation
Released: 2009-11-30
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BS EN ISO 6144:2006
Gas analysis. Preparation of calibration gas mixtures. Static volumetric method
Gas analysis. Preparation of calibration gas mixtures. Static volumetric method
Released: 2007-02-28
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BS ISO 20341:2003
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
Released: 2003-08-08
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BS ISO 19830:2015
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Released: 2015-11-30
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