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71.040.40 Chemical analysis
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BS ISO 23729:2022
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Released: 2022-08-03
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BS ISO 19318:2021
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2021-06-16
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PD ISO/TR 15969:2021
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Released: 2021-03-26
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BS ISO 7431-1:2024
Thiourea for industrial use Test methods
Thiourea for industrial use Test methods
Released: 2024-01-24
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BS ISO 6142-2:2024
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II mixtures
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II mixtures
Released: 2024-02-07
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BS ISO 13084:2025 - TC
Tracked Changes. Surface chemical analysis. Mass spectrometries. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Tracked Changes. Surface chemical analysis. Mass spectrometries. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Released: 2025-11-17
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