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71.040.40 Chemical analysis
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BS ISO 20579-2:2025
Surface chemical analysis — Sample handling, preparation and mounting Documenting and reporting the preparation and mounting of specimens for analysis
Surface chemical analysis — Sample handling, preparation and mounting Documenting and reporting the preparation and mounting of specimens for analysis
Released: 2025-02-25
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BS ISO 25095-2:2026
Propylene oxide for industrial use Determination of aldehydes by liquid chromatography
Propylene oxide for industrial use Determination of aldehydes by liquid chromatography
Released: 2026-03-24
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26/30451343 DC
BS ISO 12380 Lithium carbonate — determination of insoluble particles in acid by gravimetry
BS ISO 12380 Lithium carbonate — determination of insoluble particles in acid by gravimetry
Released: 2026-05-05
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26/30497278 DC
BS ISO 25122 Ethylene and propylene for industrial use — Determination of traces of carbon monoxide and carbon dioxide — Gas chromatographic method
BS ISO 25122 Ethylene and propylene for industrial use — Determination of traces of carbon monoxide and carbon dioxide — Gas chromatographic method
Released: 2026-01-29
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BS EN ISO 6145-8:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Diffusion method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Diffusion method
Released: 2009-02-28
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BS ISO 29081:2010
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2010-02-28
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BS ISO 12406:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Released: 2010-11-30
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BS ISO 23812:2009
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Released: 2009-05-31
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BS EN ISO 6142-1:2015
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Released: 2015-09-30
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BS 6337-2:1983
General methods of chemical analysis Method for determination of silicon content (reduced molybdosilicate spectrophotometric method)
General methods of chemical analysis Method for determination of silicon content (reduced molybdosilicate spectrophotometric method)
Released: 1983-01-31
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BS ISO 22048:2004
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
Released: 2005-03-31
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224.59 USD
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