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>CSN Standards>35 ELECTRICAL ENGINEERING>3587 Semiconductor elements>CSN EN 62374-1 - Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Released: 01.07.2011
CSN EN 62374-1 - Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

CSN EN 62374-1

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

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Number of Standard:CSN EN 62374-1
Category:358768
Pages:28
Released:01.07.2011
Catalog number:88688
DESCRIPTION

CSN EN 62374-1

CSN EN 62374-1 Tato norma popisuje zkušební metodu, zkušební strukturu a metodu pro odhad životnosti pro zkoušku časově závislého dielektrického průrazu (TDDB) pro intermetalické vrstvy vytvořené pro polovodičové součástky.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
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