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>CSN Standards>35 ELECTRICAL ENGINEERING>3587 Semiconductor elements>CSN EN 62374 - Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Released: 01.05.2008
CSN EN 62374 - Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films

CSN EN 62374

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films

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Number of Standard:CSN EN 62374
Category:358768
Pages:48
Released:01.05.2008
Catalog number:80891
DESCRIPTION

CSN EN 62374

CSN EN 62374 Norma stanovuje metodu pro zkoušení časově závislého průrazu dielektrika hradel (TDDB) a odhad tržní životnosti hradel podle výsledků této zkoušky.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
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