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Homepage>CSN Standards>35 ELECTRICAL ENGINEERING>3593 Surface mounting technology>CSN EN 62878-1-1 - Device embedded substrate - Part 1-1: Generic specification - Test methods
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CSN EN 62878-1-1 - Device embedded substrate - Part 1-1: Generic specification - Test methods

CSN EN 62878-1-1

Device embedded substrate - Part 1-1: Generic specification - Test methods

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Category:359378
Released:2015
Number of Standard:CSN EN 62878-1-1
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EN 62878-1-1


EN 62878-1-1 Device embedded substrate - Part 1-1: Generic specification - Test methods - IEC 62878-1-1:2015 specifies the test methods of passive and active device embedded substrates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

Original English text of CSN EN Standard.
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