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Homepage>CSN Standards>34 ELECTRICAL ENGINEERING>3456 Testing and measuring>CSN EN IEC 61788-17 ed. 2 - Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
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Released: 01.12.2021
CSN EN IEC 61788-17 ed. 2 - Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films

CSN EN IEC 61788-17 ed. 2

Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films

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Number of Standard:CSN EN IEC 61788-17 ed. 2
Category:345685
Pages:52
Released:01.12.2021
Catalog number:513154
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CSN EN IEC 61788-17 ed. 2

CSN EN IEC 61788-17 ed. 2 This part of IEC 61788 specifies the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is limited to the measurement without DC magnetic fields.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.