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Homepage>CSN Standards>35 ELECTRICAL ENGINEERING>3587 Semiconductor elements>CSN EN IEC 63287-2 - Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Released: 01.12.2023
CSN EN IEC 63287-2 - Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

CSN EN IEC 63287-2

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

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Number of Standard:CSN EN IEC 63287-2
Category:358777
Pages:28
Released:01.12.2023
Catalog number:517541
DESCRIPTION

CSN EN IEC 63287-2

CSN EN IEC 63287-2 Tato norma poskytuje směrnice pro sestavení kvalifikačních plánů spolehlivosti s využitím konceptu profilu nasazení na základě environmentálních podmínek a navrhovaného použití produktu. Tento dokument není určen pro vojenské a kosmické aplikace.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
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