PRICES include / exclude VAT
Homepage>IEC Standards>IEC 60068-2-10:2005+AMD1:2018 CSV - Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
Sponsored link
download between 0-24 hoursReleased: 2018-04-25
IEC 60068-2-10:2005+AMD1:2018 CSV - Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth

IEC 60068-2-10:2005+AMD1:2018 CSV

Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth

Essais d'environnement - Partie 2-10: Essais - Essai J et guide: Moisissures

Format
Availability
Price and currency
English/French - Bilingual PDF
Immediate download
409.44 USD
English/French - Bilingual Hardcopy
in stock
409.44 USD
Standard number:IEC 60068-2-10:2005+AMD1:2018 CSV
Released:2018-04-25
Language:English/French - Bilingual
DESCRIPTION

IEC 60068-2-10:2005+AMD1:2018 CSV

IEC 60068-2-10:2005+A1:2018 provides a test method for determining the extent to which electrotechnical products support mould growth and how any mould growth may affect the performance and other relevant properties of the product. Since mould growth conditions include high relative humidity, the test is applicable to electrotechnical products intended for transportation, storage and use under humid conditions over a period of some days at least. The main changes with respect to the previous edition are listed below: - Two test fungi replaced by two others - Concentration of the spores defined for each test fungus - Spores suspension in mineral salt solution additionally introduced - Pre-conditioning of the specimens by damp heat storage prescribed - Supersonic aerosolization of the spores suspension as the preferred inoculation method introduced - Duration of incubation reduced from 84 days to 56 days - Extent of mould growth grade 2 split into grade 2a and grade 2b - Detailed information on methods of inoculation given in Annex B - Annex E: flow-chart deleted This consolidated version consists of the sixth edition (2005) and its amendment 1 (2018). Therefore, no need to order amendment in addition to this publication.