IEC 60512-26-100:2008+AMD1:2011 CSV
Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g
Connecteurs pour équipements électroniques - Essais et mesures - Partie 26-100: Montage de mesure, dispositifs d'essai et de référence et mesures pour les connecteurs conformes à la CEI 60603-7 - Essais 26a à 26g
| Standard number: | IEC 60512-26-100:2008+AMD1:2011 CSV |
| Released: | 2011-05-25 |
| Language: | English/French - Bilingual |
IEC 60512-26-100:2008+AMD1:2011 CSV
IEC 60512-26-100:2008+A1:2011 specifies the test and measurements and the related measurement setup and reference arrangements for interoperability and backward compatibility tests for the development and qualification of 8-way, free and fixed connectors for data transmission. The following test methods are provided: - insertion loss, test 26a; - return loss, test 26b; - near-end crosstalk (NEXT), test 26c; - far-end crosstalk (FEXT), test 26d; - transfer impedance, test 26e; - transverse conversion loss (TCL), test 26f; - transverse conversion transfer loss (TCTL), test 26g. This publication is to be read in conjunction with IEC 60512-1:2001 and IEC 60512-1-100:2006. This consolidated version consists of the first edition (2008) and its amendment 1 (2011). Therefore, no need to order amendment in addition to this publication.