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Homepage>IEC Standards>IEC 60747-18-4:2023 - Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
download between 0-24 hoursReleased: 2023-03-16
IEC 60747-18-4:2023 - Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

IEC 60747-18-4:2023

Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

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Standard number:IEC 60747-18-4:2023
Released:2023-03-16
Language:English
DESCRIPTION

IEC 60747-18-4:2023

IEC 60747-18-4:2023(E) specifies the evaluation method for noise characteristics of lens-free CMOS photonic array sensors. This document includes the measurement setup, test procedure, test items, evaluation method, and test report for noise characteristics of lens-free CMOS photonic array sensors.

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