Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 12: Vibrations, fréquences variables
|Standard number:||IEC 60749-12:2017|
|Language:||English/French - Bilingual|
IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.