Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 USD
PRICES include / exclude VAT
Homepage>IEC Standards>IEC 60749-13:2018 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Sponsored link
download between 0-24 hoursReleased: 2018-02-15
IEC 60749-13:2018 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

IEC 60749-13:2018

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Dispositifs à seminconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 13: Atmosphère saline

Format
Availability
Price and currency
English/French - Bilingual PDF
Immediate download
97.78 USD
English/French - Bilingual Hardcopy
in stock
97.78 USD
Standard number:IEC 60749-13:2018
Released:2018-02-15
Language:English/French - Bilingual
DESCRIPTION

IEC 60749-13:2018

IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

Print