Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 17: Irradiation aux neutrons
|Standard number:||IEC 60749-17:2019|
|Language:||English/French - Bilingual|
IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition: updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose; addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.