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Homepage>IEC Standards>IEC 61000-4-4:2012 RLV - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
download between 0-24 hoursReleased: 2012-04-30
IEC 61000-4-4:2012 RLV - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test

IEC 61000-4-4:2012 RLV

Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test

Compatibilité électromagnétique (CEM) - Partie 4-4: Techniques d'essai et de mesure - Essai d'immunité aux transitoires électriques rapides en salves

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429.00 USD
English Hardcopy
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429.00 USD
Standard number:IEC 61000-4-4:2012 RLV
Released:2012-04-30
Language:English
DESCRIPTION

IEC 61000-4-4:2012 RLV

IEC 61000-4-4:2012 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61000-4-4:2012 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It has the status of a basic EMC publication in accordance with IEC Guide 107. It gives immunity requirements and test procedures related to electrical fast transients/bursts. It additionally defines ranges of test levels and establishes test procedures. The object of this standard is to establish a common and reproducible reference in order to evaluate the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this standard describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. This third edition cancels and replaces the second edition published in 2004 and its amendment 1 (2010). It constitutes a technical revision which improves and clarifies simulator specifications, test criteria and test setups.

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