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Homepage>IEC Standards>IEC 61967-6:2002 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
download between 0-24 hoursReleased: 2002-06-25
IEC 61967-6:2002 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

IEC 61967-6:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

Circuits intégrés - Mesure des émissions électromagnétiques, 150 kHz à 1 GHz - Partie 6: Mesure des émissions conduites - Méthode de la sonde magnétique

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Standard number:IEC 61967-6:2002
Released:2002-06-25
Language:English/French - Bilingual
DESCRIPTION

IEC 61967-6:2002

Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. The contents of the corrigendum of August 2010 have been included in this copy.

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