PRICES include / exclude VAT
Homepage>IEC Standards>IEC 62047-32:2019 - Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators
Sponsored link
download between 0-24 hoursReleased: 2019-01-24
IEC 62047-32:2019 - Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators

IEC 62047-32:2019

Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators

Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 32: Méthode d’essai pour la vibration non linéaire des résonateurs MEMS

CURRENCY
LANGUAGE
English/French - Bilingual
Standard number:IEC 62047-32:2019
Released:2019-01-24
Language:English/French - Bilingual
DESCRIPTION

IEC 62047-32:2019

IEC 62047-32:2019 specifies the test method and test condition for the nonlinear vibration of MEMS resonators. The statements made in this document apply to the development and manufacture for MEMS resonators.

This product includes: