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Main page>IEC Standards>IEC 62047-56:2026 - Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor
immediate downloadReleased: 2026-10-28
IEC 62047-56:2026 - Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

IEC 62047-56:2026

Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

Traitement de l'information - Matérialisation du jeu de caractères codés à 7 éléments et de ses extensions à 7 et 8 éléments pour l'échange d'information sur cassette de bande magnétique de 3,81 mm de large

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Standard number:IEC 62047-56:2026
Released:2026-10-28
Language:English
Edition:1
ICS:31.080.99
Pages (English):13
ISBN (English):9782832715680
DESCRIPTION

IEC 62047-56:2026

IEC 62047-56:2026 specifies the requirements and test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor.

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