PRICES include / exclude VAT
Homepage>IEC Standards>IEC 62951-2:2019 - Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
Sponsored link
download between 0-24 hoursReleased: 2019-04-17
IEC 62951-2:2019 - Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices

IEC 62951-2:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices

Dispositifs à semiconducteurs - Dispositifs à semiconducteurs souples et extensibles - Partie 2 : Méthode d’évaluation pour la mobilité des électrons, la pente en régime de sous-seuil et la tension de seuil des dispositifs souples

CURRENCY
LANGUAGE
English/French - Bilingual
Standard number:IEC 62951-2:2019
Released:2019-04-17
Language:English/French - Bilingual
DESCRIPTION

IEC 62951-2:2019

IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin‑film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.