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Homepage>IEC Standards>IEC 62951-5:2019 - Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
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download between 0-24 hoursReleased: 2019-02-27
IEC 62951-5:2019 - Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials

IEC 62951-5:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials

Dispositifs à semiconducteurs - Dispositifs à semiconducteurs souples et extensibles - Partie 5 : Méthode d’essai pour les caractéristiques thermiques des matériaux souples

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English/French - Bilingual
Standard number:IEC 62951-5:2019
Released:2019-02-27
Language:English/French - Bilingual
DESCRIPTION

IEC 62951-5:2019

IEC 62951-5:2019 specifies the test method for thermal characteristics of flexible materials. This document includes terms, definitions, symbols, and test methods that can be used to evaluate and determine thermal characteristics of flexible materials for practical use. The measurement method relies on non-contact optical thermometry that is based on temperature dependent optical reflectance. This document is applicable to both substrate and thin-film flexible semiconductor materials that are subjected to bending and stretching.