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Homepage>IEC Standards>IEC 62951-6:2019 - Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
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download between 0-24 hoursReleased: 2019-05-06
IEC 62951-6:2019 - Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films

IEC 62951-6:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films

Dispositifs à semiconducteurs - Dispositifs à semiconducteurs souples et extensibles - Partie 6: Méthode d’essai pour la résistance de couche des couches conductrices souples

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English/French - Bilingual
Standard number:IEC 62951-6:2019
Released:2019-05-06
Language:English/French - Bilingual
DESCRIPTION

IEC 62951-6:2019

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

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