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Main page>IEC Standards>IEC 62969-4:2018 - Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
immediate downloadReleased: 2018-06-18
IEC 62969-4:2018 - Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

IEC 62969-4:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

Dispositifs à semiconducteurs – Interface à semiconducteurs pour les véhicules automobiles - Partie 4: Méthode d'évaluation de l'interface de données destinée aux capteurs de véhicules automobiles

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English/French - Bilingual PDF
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Standard number:IEC 62969-4:2018
Released:2018-06-18
Edition:1
ICS:31.080.99
Pages (English/French - Bilingual):39
ISBN (English/French - Bilingual):9782832257913
DESCRIPTION

IEC 62969-4:2018

IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.

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