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Homepage>IEC Standards>IEC 63003:2015 - Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
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download between 0-24 hoursReleased: 2015-12-14
IEC 63003:2015 - Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

IEC 63003:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

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Standard number:IEC 63003:2015
Released:2015-12-14
Language:English
DESCRIPTION

IEC 63003:2015

IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

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