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Homepage>IEC Standards>IEC 63150-1:2019 - Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
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download between 0-24 hoursReleased: 2019-05-10
IEC 63150-1:2019 - Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations

IEC 63150-1:2019

Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations

Dispositifs à semiconducteurs - Méthodes de mesure et d’évaluation des dispositifs de captage d’énergie cinétique dans un environnement de vibrations concret - Partie 1: Vibrations mécaniques arbitraires et aléatoires

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English/French - Bilingual
Standard number:IEC 63150-1:2019
Released:2019-05-10
Language:English/French - Bilingual
DESCRIPTION

IEC 63150-1:2019

IEC 63150-1:2019 specifies terms and definitions, and test methods for kinetic energy harvesting devices for one-dimensional mechanical vibrations to determine the characteristic parameters under a practical vibration environment. Such vibration energy harvesting devices often have their own non-linear mechanisms to efficiently capture vibration energy in a broadband frequency range. This document is applicable to vibration energy harvesting devices with different power generation principles (such as electromagnetic, piezoelectric, electrostatic, etc.) and with different non-linear behaviour to the external mechanical excitation.