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Main page>IEC Standards>IEC 63202-1:2019 - Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
immediate downloadReleased: 2019-06-20
IEC 63202-1:2019 - Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells

IEC 63202-1:2019

Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells

Cellules photovoltaïques - Partie 1: Mesure de la dégradation induite par la lumière des cellules photovoltaïques au silicium cristallin

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Standard number:IEC 63202-1:2019
Released:2019-06-20
Edition:1
ICS:27.160
Pages (English/French - Bilingual):17
ISBN (English/French - Bilingual):9782832268964
DESCRIPTION

IEC 63202-1:2019

IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.

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