PRICES include / exclude VAT
Sponsored link
download between 0-24 hoursReleased: 2017-10-11
IEC TR 63133:2017
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
Format
Availability
Price and currency
English PDF
Immediate download
140.56 USD
English Hardcopy
in stock
140.56 USD
| Standard number: | IEC TR 63133:2017 |
| Released: | 2017-10-11 |
| Language: | English |
DESCRIPTION
IEC TR 63133:2017
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.