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Homepage>IEEE Standards>35 INFORMATION TECHNOLOGY. OFFICE MACHINES>35.200 Interface and interconnection equipment>IEEE 1149.1-1990 - IEEE Standard Test Access Port and Boundary-Scan Architecture
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Released: 21.05.1990

IEEE 1149.1-1990 - IEEE Standard Test Access Port and Boundary-Scan Architecture

IEEE Standard Test Access Port and Boundary-Scan Architecture

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173.44 USD
Standard number:IEEE 1149.1-1990
Released:21.05.1990
ISBN:978-1-55937-350-0
Pages:139
Status:Active
Language:English
DESCRIPTION

IEEE 1149.1-1990





Revision Standard - Superseded. Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.
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