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Main page>IEEE Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>IEEE 3138-2026 - IEEE Standard for General Requirements of Chip Visual Inspection in the Surface Mount Industry
Released: 24.07.2026

IEEE 3138-2026

IEEE Standard for General Requirements of Chip Visual Inspection in the Surface Mount Industry

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Standard number:IEEE 3138-2026
Released:24.07.2026
ISBN:979-8-8557-3538-3
Pages:43
Status:Active
Language:English
DESCRIPTION

IEEE 3138-2026

This standard specifies the general requirements of visual inspection of surface mount device (SMD) for surface mount technology (SMT) machines, including the format of chip parameters data exchange, the function and technical requirements of each module of the visual inspection algorithm, and the storage structure of chip parameters. This standard specifies unified data format and interfaces of the algorithms between different SMT machines.



New IEEE Standard - Active. General requirements of visual inspection of surface mount devices (SMD) for surface mount technology (SMT) machines, including the format of chip parameters data exchange, the function and technical requirements of each module of the visual inspection algorithm, and the storage structure of chip parameters are specified in this standard. Unified data format and interfaces of the algorithms between different SMT machines are also specified in this standard.