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Released: 05.02.1991
IEEE 592-1990 - IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors
IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors
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English PDF
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119.99 USD
| Withdraw: | 07.02.2003 |
| Standard number: | IEEE 592-1990 |
| Released: | 05.02.1991 |
| ISBN: | 978-0-7381-3749-0 |
| Pages: | 10 |
| Status: | Inactive |
| Language: | English |
DESCRIPTION
IEEE 592-1990
This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.Revision Standard - Inactive-Withdrawn. This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.