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Released: 07.10.1988
IEEE 641-1987 - IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays
IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays
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English PDF
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123.56 USD
| Withdraw: | 03.12.1992 |
| Standard number: | IEEE 641-1987 |
| Released: | 07.10.1988 |
| ISBN: | 978-0-7381-4235-7 |
| Pages: | 34 |
| Status: | Inactive |
| Language: | English |
DESCRIPTION
IEEE 641-1987
New IEEE Standard - Inactive-Withdrawn. This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.