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>IEEE Standards>35 INFORMATION TECHNOLOGY. OFFICE MACHINES>35.240 Applications of information technology>35.240.30 IT applications in information, documentation and publishing

35.240.30 IT applications in information, documentation and publishing

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23 results
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IEEE 1671.5-2008 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
Released: 01.02.2012
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64.15 USD
IEEE 1671.2-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
Released: 17.12.2008
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152.20 USD
IEEE 1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
Released: 15.02.2013
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158.95 USD
English PDF Redline
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158.95 USD
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130.82 USD
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118.93 USD
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155.98 USD
IEEE 1671.1-2017/Cor 1-2023 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1
IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1
Released: 26.04.2024
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0.00 USD
IEEE 1671.1-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
Released: 19.03.2018
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245.86 USD
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308.75 USD
IEEE 1671.3-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
Released: 13.04.2018
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189.94 USD
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237.74 USD
IEEE 1671.3-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
Released: 28.03.2008
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114.47 USD
IEEE/IEC 61671-4-2016 - IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration
IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration
Released: 08.04.2016
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98.12 USD
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125.79 USD
IEEE 1871.1-2014 - IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
Released: 10.02.2015
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236.48 USD
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235.56 USD
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293.08 USD
IEEE 1871.2-2017 - IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment
IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment
Released: 14.03.2018
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67.93 USD
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85.54 USD
IEEE/IEC 61671-6-2016 - IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description
IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description
Released: 08.04.2016
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77.99 USD
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95.60 USD
IEEE 1671.4-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
Released: 30.04.2008
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130.82 USD
23 results
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