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>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices
immediate downloadReleased: 2018-01-29
PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices

PD IEC/TR 63133:2017

Semiconductor devices. Scan based ageing level estimation for semiconductor devices

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Standard number:PD IEC/TR 63133:2017
Pages:20
Released:2018-01-29
ISBN:978 0 580 98851 6
Status:Standard
DESCRIPTION

PD IEC/TR 63133:2017


This standard PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

This Technical Report specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.


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