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Homepage>BS Standards>07 MATHEMATICS. NATURAL SCIENCES>07.030 Physics. Chemistry>PD IEC/TS 62607-6-4:2016 Nanomanufacturing. Key control characteristics Graphene. Surface conductance measurement using resonant cavity
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PD IEC/TS 62607-6-4:2016 Nanomanufacturing. Key control characteristics Graphene. Surface conductance measurement using resonant cavity

PD IEC/TS 62607-6-4:2016

Nanomanufacturing. Key control characteristics Graphene. Surface conductance measurement using resonant cavity

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Standard number:PD IEC/TS 62607-6-4:2016
Pages:22
Released:2016-10-31
ISBN:978 0 580 91019 7
Status:Standard
DESCRIPTION

PD IEC/TS 62607-6-4:2016


This standard PD IEC/TS 62607-6-4:2016 Nanomanufacturing. Key control characteristics is classified in these ICS categories:
  • 07.120 Nanotechnologies
  • 07.030 Physics. Chemistry

This part of IEC 62607 establishes a method for determining the surface conductance of two-dimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite [3]. The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz [4].

Surface conductance measurement by resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area. This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area.