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>Buy European Standards (EN) Online | EN, ISO, IEC, BSI | Immediate PDF Download

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197545 results
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UNE EN 61987-22:2016
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 22: Lists of Properties (LOPs) of valve body assemblies for electronic data exchange (Endorsed by AENOR in March of 2016.)
Released: 2016-03-01
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UNE EN 61988-2-4:2011
Plasma display panels - Part 2-4: Measuring methods - Visual quality: Image artifacts (Endorsed by AENOR in January of 2012.)
Released: 2012-01-01
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106.12 USD
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UNE EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications -- Part 2: Measuring methods (Endorsed by AENOR in June of 2009.)
Released: 2009-06-01
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111.29 USD
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UNE EN 62026-2:2013/A1:2019
Low-voltage switchgear and controlgear - Controller-device interfaces (CDIs) - Part 2: Actuator sensor interface (AS-i) (Endorsed by Asociación Española de Normalización in January of 2020.)
Released: 2020-01-01
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76.35 USD
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UNE EN 62027:2012
Preparation of object lists, including parts lists (Endorsed by AENOR in March of 2012.)
Released: 2012-03-01
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UNE EN 62040-4:2013
Uninterruptible power systems (UPS) - Part 4: Environmental aspects - Requirements and reporting (Endorsed by AENOR in November of 2013.)
Released: 2013-11-01
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UNE EN 62040-5-3:2017
Uninterruptible power systems (UPS) - Part 5-3: DC output UPS - Performance and test requirements (Endorsed by Asociación Española de Normalización in March of 2017.)
Released: 2017-03-01
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UNE EN 62047-13:2012
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (Endorsed by AENOR in June of 2012.)
Released: 2012-06-01
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UNE EN 62047-17:2015
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films (Endorsed by AENOR in August of 2015.)
Released: 2015-08-01
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UNE EN 62047-3:2006
Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile testing (IEC 62047-3:2006) (Endorsed by AENOR in January of 2007.)
Released: 2007-01-01
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53.06 USD
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UNE EN 62047-4:2010
Semiconductor devices - Micro-electromechanical devices -- Part 4: Generic specification for MEMS (Endorsed by AENOR in February of 2011.)
Released: 2011-02-01
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UNE EN 62047-7:2011
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
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197545 results
First page123...1450014501145021450314504...164611646216463Last page