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>31.080 Semiconductor devices

31.080 Semiconductor devices

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19 results
12Last page
IEEE/ANSI N42.31-2003 - American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
Released: 20.08.2003
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103.71 EUR
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120.82 EUR
IEEE 641-1987 - IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays
IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays
Released: 07.10.1988
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111.20 EUR
IEEE 1620.1-2006 - IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
Released: 08.11.2006
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87.67 EUR
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79.70 EUR
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103.71 EUR
IEEE 255-1963 - IEEE Standard Letter Symbols for Semiconductor Devices
IEEE Standard Letter Symbols for Semiconductor Devices
Released: 01.12.1963
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53.46 EUR
IEEE 1005-1991 - IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
Released: 17.10.1991
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98.37 EUR
IEEE 1005-1998 - IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays
IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays
Released: 09.02.1999
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174.28 EUR
IEEE 1620-2008 - IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
Released: 05.12.2008
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133.65 EUR
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98.37 EUR
IEEE 1804-2017 - IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
Released: 31.01.2018
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57.74 EUR
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72.71 EUR
IEEE/IEC 62860-1-2013 - IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
Released: 30.07.2013
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148.62 EUR
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178.56 EUR
IEEE 449-1990 - IEEE Standard for Ferroresonant Voltage Regulators
IEEE Standard for Ferroresonant Voltage Regulators
Released: 16.05.1990
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103.71 EUR
IEEE 581-1978 - IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors
IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors
Released: 28.04.1978
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53.46 EUR
IEEE 216-1960 - IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms
IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms
Released: 31.10.1960
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13.90 EUR
19 results
12Last page