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Homepage>UNE standards>UNE EN 60512-6-2:2002 Connectors for electronic equipment - Tests and measurements -- Part 6-2: Dynamic stress tests - Test 6b: Bump.
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in stockReleased: 2002-12-16
UNE EN 60512-6-2:2002 Connectors for electronic equipment - Tests and measurements -- Part 6-2: Dynamic stress tests - Test 6b: Bump.

UNE EN 60512-6-2:2002

Connectors for electronic equipment - Tests and measurements -- Part 6-2: Dynamic stress tests - Test 6b: Bump.

Conectores para equipos electrónicos. Ensayos y mediciones. Parte 6-2: Ensayos de esfuerzos dinámicos. Ensayo 6b: Sacudida.

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Standard number:UNE EN 60512-6-2:2002
Pages:17
Released:2002-12-16
DESCRIPTION
This standard UNE EN 60512-6-2:2002 Connectors for electronic equipment - Tests and measurements -- Part 6-2: Dynamic stress tests - Test 6b: Bump. is classified in these ICS categories:
  • 31.220.10