Homepage>UNE standards>UNE EN 60749-10:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.
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UNE EN 60749-10:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 10: Choques mecánicos.
CURRENCY
Standard number:
UNE EN 60749-10:2003
Pages:
15
Released:
2003-05-30
Status:
Standard
DESCRIPTION
This standard UNE EN 60749-10:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock. is classified in these ICS categories:
