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Homepage>UNE standards>UNE EN 60749-25:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
in stockReleased: 2004-06-11
UNE EN 60749-25:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling

UNE EN 60749-25:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 25: Ciclos de temperatura.

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English PDF
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91.62 USD
English Hardcopy
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Spanish PDF
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76.35 USD
Spanish Hardcopy
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76.35 USD
Standard number:UNE EN 60749-25:2004
Pages:33
Released:2004-06-11
Status:Standard
Pages (Spanish):16
Pages (English):33
DESCRIPTION

This standard UNE EN 60749-25:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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