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>UNE standards>UNE EN 62047-10:2011 - Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (Endorsed by AENOR in December of 2011.)
in stockReleased: 2011-12-01
UNE EN 62047-10:2011 - Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (Endorsed by AENOR in December of 2011.)

UNE EN 62047-10:2011

Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (Endorsed by AENOR in December of 2011.)

Dispositivos semiconductores. Dispositivos micro-electromecánicos. Parte 10: Ensayo de compresión de los micropilares en materiales MEMS. (Ratificada por AENOR en diciembre de 2011.)

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Standard number:UNE EN 62047-10:2011
Pages:15
Released:2011-12-01
Status:Standard
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UNE EN 62047-10:2011