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in stockReleased: 2012-06-01
UNE EN 62047-13:2012
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (Endorsed by AENOR in June of 2012.)
Dispositivos semiconductores. Dispositivos micro-electromecánicos. Parte 13: Métodos de medición del ensayo tipo de resistencia adhesiva al curvado y cizallamiento para estructuras MEMS (Ratificada por AENOR en junio de 2012.)
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| Standard number: | UNE EN 62047-13:2012 |
| Pages: | 18 |
| Released: | 2012-06-01 |
DESCRIPTION
This standard UNE EN 62047-13:2012 Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (Endorsed by AENOR in June of 2012.) is classified in these ICS categories:
- 31.080.99